Deterministic Test Vector Decompression in Software Using Linear Operations
نویسندگان
چکیده
Anewsoftware-baseddtestvectorcompressionn technique is proposedd for usingg ann embeddedd processor too test the other components of aa system-on-a-chipp (SOC). The tester transfers compressedd test dataa too the processor's on-chipp memory, andd the processor executes aa small program whichh decompresses the dataa andd applies it too the scann chains of eachh core-under-test. The proposedd decompressionn procedure uses word-basedd linear operations too expandd the compressedd test dataa intoo the correspondingg deterministic test vectors. It has aa number of nice features that overcome the drawbacks of software-basedd linear feedback shift register (LFSR) reseeding. The storage requirements for the proposedd approachh dependd only onn the total number of specifiedd bits inn the test set. There are noo restrictions onn static compactionn or the test generationn procedure as aa whole. The decompressionn program cann be easily reusedd for applyinggdifferenttestsets.Experimentalresults demonstrate that the proposedd approachh compares very favorably withh all previously publishedd results for software-basedd test vector decompression.
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